A fast model-based technique for SRAF placements is proposed in this paper. This technique first constructed an image
pixel map with values presenting the sensitivity of improving process window on the desired pattern. The sensitivity
value was derived based on contrast improvement with a defocus model. Then high value pixels were selected and
constructed to form SRAF with MRC regulations. This technique does not require iterations to produce SRAF and
achieves very fast runtime with simple mask shapes, thus can be used in full-chip productions. We called this technique
the SRAF guidance map, SGM
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