Dr. Jonathan D. Ellis Profile

Dr. Jonathan D. Ellis

Principal Manufacturing Technologies Engineer at Edmund Optics

SPIE Involvement:

Conference Program Committee | Author | Editor

Area of Expertise:

Optomechanical Design , Precision Engineering , Instrumentation , Optical Metrology , Data Analytics , Education

Websites:

Company Website

Publications (20)

Proceedings Article | 30 November 2023 Presentation + Paper

Effect of rake angle for diamond turning of tungsten carbide

H. Shirzadi Jahromi, S. Kode, R. Sharma, J. Ellis

Proceedings Volume 12778, 1277808 (2023) https://doi.org/10.1117/12.2691777

KEYWORDS: Tungsten, Laser cutting, Single point diamond turning, Diamond machining, Precision diamond machining, Diamond, Diamond turning, Laser energy, Surface finishing, Semiconductor lasers

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Proceedings Article | 30 November 2023 Presentation + Paper

Effect of polishing times for glass optics after laser-assisted single point diamond turning

Jonathan Ellis, Sai Kode, Dalibor Mikulic, Frank Niehaus

Proceedings Volume 12778, 127780F (2023) https://doi.org/10.1117/12.2691778

KEYWORDS: Polishing, Glasses, Diamond turning, Surface finishing, Diamond, Magnetorheological finishing, Diamond machining, Single point diamond turning

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Proceedings Article | 4 October 2022 Presentation + Paper

Laser assisted diamond turning of tungsten carbide and the material properties required to obtain optical surface finish suitable for lens molds

Sai Kumar Kode, Jonathan Ellis, Hossein Mohammadi

Proceedings Volume 12219, 1221906 (2022) https://doi.org/10.1117/12.2635954

KEYWORDS: Tungsten, Diamond, Surface finishing, Diamond turning, Surface roughness, Single point diamond turning, Polishing, Diamond machining, Scanning electron microscopy, Photography

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Proceedings Article | 11 August 2021 Presentation + Paper

Lessons learned while (maybe) educating optomechanical engineers

Jonathan Ellis

Proceedings Volume 11816, 118160C (2021) https://doi.org/10.1117/12.2596789

KEYWORDS: Physics, Mechanical engineering, Engineering education, Computer aided design, Mathematics, Metrology, Geometrical optics, Optical engineering, Calculus, Optical mounts

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Proceedings Article | 19 September 2018 Paper

Calibration methods for a dual-wavelength interferometer system

Yanqi Zhang, Martin Tangari Larrategui, Thomas Brown, Jonathan Ellis

Proceedings Volume 10747, 1074707 (2018) https://doi.org/10.1117/12.2323127

KEYWORDS: Wavefronts, Interferometers, Calibration, Interferometry, Imaging systems, Beam splitters, Collimation, Chromatic aberrations, Optical alignment, Sensors

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Proceedings Article | 8 March 2018 Presentation + Paper

Measurement and design of refractive corrections using ultrafast laser-induced intra-tissue refractive index shaping in live cats

Daniel Brooks, Kaitlin Wozniak, Wayne Knox, Jonathan Ellis, Krystel Huxlin

Proceedings Volume 10474, 104741B (2018) https://doi.org/10.1117/12.2290132

KEYWORDS: Cornea, Calibration, Eye, In vivo imaging, Fresnel lenses, Wavefronts, Refractive index, Laser vision correction

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Proceedings Article | 19 February 2018 Presentation + Paper

Scattering properties of ultrafast laser-induced refractive index shaping lenticular structures in hydrogels

Kaitlin Wozniak, Thomas Germer, Sam Butler, Daniel Brooks, Krystel Huxlin, Jonathan Ellis

Proceedings Volume 10522, 1052205 (2018) https://doi.org/10.1117/12.2290204

KEYWORDS: Diffraction, Cornea, Scattering, Light scattering, Femtosecond phenomena, Laser vision correction, Refractive index, Scatter measurement, Laser tissue interaction

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SPIE Journal Paper | 24 May 2017 Open Access

Comparable change in stromal refractive index of cat and human corneas following blue-IRIS

Kaitlin Wozniak, Sara Gearhart, Daniel Savage, Jonathan Ellis, Wayne Knox, Krystel Huxlin

JBO, Vol. 22, Issue 05, 055007, (May 2017) https://doi.org/10.1117/12.10.1117/1.JBO.22.5.055007

KEYWORDS: Cornea, Tissues, Refractive index, Diffraction, Diffraction gratings, Femtosecond phenomena, Eye, Natural surfaces, Laser vision correction, Glasses

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SPIE Journal Paper | 28 June 2016

Absolute air refractive index measurement and tracking based on variable length vacuum cell

Xiangzhi Yu, Tieli Zhang, Jonathan Ellis

OE, Vol. 55, Issue 06, 064112, (June 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.6.064112

KEYWORDS: Refractive index, Beam splitters, Signal detection, Interferometers, Environmental sensing, Sensors, Photodetectors, Optical tracking, Phase measurement, Humidity

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Proceedings Article | 12 October 2015 Paper

Homodyne displacement measuring interferometer probe for optical coordinate measuring machine with tip and tilt sensitivity

Sam Butler, Michael Ricci, Chen Wang, Qun Wei, Jonathan Ellis

Proceedings Volume 9633, 96332E (2015) https://doi.org/10.1117/12.2195966

KEYWORDS: Homodyne detection, Interferometers, Freeform optics, Heterodyning, Polarization, Optical testing, Interferometry, Photodetectors, CMOS sensors, Metrology

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Proceedings Article | 2 September 2015 Paper

Interferometric strain measurements with a fiber-optic probe

E. Burnham-Fay, D. Jacobs-Perkins, J. Ellis

Proceedings Volume 9576, 95760F (2015) https://doi.org/10.1117/12.2188837

KEYWORDS: Interferometers, Heterodyning, Sensors, Fiber optics, Metrology, Phase measurement, Fiber optics tests, Optical testing, Environmental sensing, Interferometry

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SPIE Journal Paper | 16 June 2014

Polarization model for total internal reflection-based retroreflectors

Minhao Zhu, Yan Li, Jonathan Ellis

OE, Vol. 53, Issue 06, 064101, (June 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.6.064101

KEYWORDS: Polarization, Retroreflectors, Refraction, Solids, Motion models, Refractive index, Lithium, Optical engineering, Interferometers

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Proceedings Article | 12 March 2014 Paper

Focused beam scatterometry for deep subwavelength metrology

Thomas Brown, Miguel Alonso, Anthony Vella, Michael Theisen, Stephen Head, Steven Gillmer, Jonathan Ellis

Proceedings Volume 8949, 89490Y (2014) https://doi.org/10.1117/12.2045651

KEYWORDS: Scatterometry, Polarization, Dielectric polarization, Scattering, Light scattering, Metrology, Semiconductors, Critical dimension metrology, Laser scattering, Oxides

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Proceedings Article | 12 March 2014 Paper

Amplitude, phase, and polarization control with a single spatial light modulator

Michael Theisen, Stephen Head, Thomas Brown, Steven Gillmer, Jonathan Ellis

Proceedings Volume 8949, 89491X (2014) https://doi.org/10.1117/12.2045965

KEYWORDS: Polarization, Spatial light modulators, Polarization control, Calcite, Wave plates, Beam splitters, Polarimetry, Crystals, Optical spheres, Interferometers

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SPIE Press Book | 7 January 2014

Field Guide to Displacement Measuring Interferometry

Jonathan Ellis

KEYWORDS: Interferometers, Interferometry, Mirrors, Refractive index, Polarization, Heterodyning, Error analysis, Phase measurement, Homodyne detection, Signal detection

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Field Guide to Displacement Measuring Interferometry

Proceedings Article | 15 October 2013 Paper

Effects of varying machine stiffness and contact area in UltraForm Finishing

Dennis Briggs, Samantha Echaves, Brendan Pidgeon, Nathan Travis, Jonathan Ellis

Proceedings Volume 8884, 888405 (2013) https://doi.org/10.1117/12.2029369

KEYWORDS: Polishing, Surface finishing, Sensors, Optical testing, Abrasives, Particles, Freeform optics, Cerium, Oxides, Computing systems

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Proceedings Article | 15 October 2013 Paper

Slope-sensitive optical probe for freeform optics metrology

Michael Echter, Andrew Keene, Christopher Roll, Jonathan Ellis

Proceedings Volume 8884, 88842C (2013) https://doi.org/10.1117/12.2029249

KEYWORDS: Freeform optics, Sensors, Imaging systems, CMOS sensors, Metrology, Optics manufacturing, Fringe analysis, Electronic test equipment, Interferometers, Mirrors

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Proceedings Article | 18 September 2013 Paper

Design considerations in a novel fiber-coupled three degree-of-freedom displacement interferometer

Steven Gillmer, Jonathan Ellis

Proceedings Volume 8836, 883604 (2013) https://doi.org/10.1117/12.2023358

KEYWORDS: Interferometers, Optical fibers, Calibration, Mirrors, Sensors, Beam splitters, Bragg cells, Collimators, Wavefront sensors, Kinematics

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Proceedings Article | 7 September 2013 Paper

Accurately measuring dynamic coefficient of friction in ultraform finishing

Dennis Briggs, Samantha Echaves, Brendan Pidgeon, Nathan Travis, Jonathan Ellis

Proceedings Volume 8838, 88380U (2013) https://doi.org/10.1117/12.2024494

KEYWORDS: Polishing, Optical testing, Magnetorheological finishing, Glasses, Freeform optics, Ceramics, Abrasives, Manufacturing, Capacitance, Sensors

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Proceedings Article | 24 September 2011 Paper

Training of optomechanical engineers at the University of Rochester

Victor Genberg, Jonathan Ellis

Proceedings Volume 8125, 812506 (2011) https://doi.org/10.1117/12.892577

KEYWORDS: Mechanical engineering, Optomechanical design, Metrology, Glasses, Optical instrument design, Telescopes, Optical engineering, Thermography, Crystal optics, Computer aided design

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