In this study, we developed THz time-of-flight imaging based on all-reflective optics to preserve the high-frequency components of a THz antenna for inline applications. In particular, asynchronous optical sampling enables rapid scanning at 200 Hz per pixel with a full time-delay of 10 ns. This configuration enabled us to obtain phase and amplitude images with a spatial resolution of 0.5 mm for non-destructive testing applications such as finding defects in packaged chips. Also, we introduced conformal mapping techniques for maintaining high spatial resolution, applicable for objects with variable heights.
Conference Committee Involvement (11)
Components and Packaging for Laser Systems XI
25 January 2025 | San Francisco, California, United States
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