PROCEEDINGS VOLUME 3204
INTELLIGENT SYSTEMS AND ADVANCED MANUFACTURING | 14-17 OCTOBER 1997
Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III
Editor(s): Kevin G. Harding, Donald J. Svetkoff
Editor Affiliations +
INTELLIGENT SYSTEMS AND ADVANCED MANUFACTURING
14-17 October 1997
Pittsburgh, PA, United States
Stereo, Focus and Interferometric Methods
Leonard H. Bieman, Kevin G. Harding
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294441
Murali Subbarao, Ta Yuan, JennKwei Tyan
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294452
Murali Subbarao, Yen-Fu Liu
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294461
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294464
Hua Fan, Yuanhe Song, Yushan Tan
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294465
Structured Light and Triangulation: Methods
Dennis P. Sarr, Joey H. Mullen
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294466
Robert J. Beeson
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294442
Denis Perard, Juergen Beyerer
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294443
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294444
Wenwei Zhang, Bao Hua Zhuang
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294445
Bao Hua Zhuang, Shuo-Jen Lee, Wenwei Zhang
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294446
Structured Light and Triangulation: Tools
Laurence G. Hassebrook, Raymond C. Daley, William J. Chimitt Jr.
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294447
Miguel Arevalillo Herraez, David B. Clegg, David R. Burton, Michael J. Lalor
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294448
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294449
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294450
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294451
3D Methods for Reverse Engineering Applications
Liang-Chia Chen, Grier C. I. Lin
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294453
Vincent H. Chan, Colin H. Bradley, Geoffrey W. Vickers
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294454
Vania Conan, Pascal Aubry
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294455
3D Modeling Methods
Hideo Saito, Satoshi Kirihara
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294456
Vincent H. Chan, Colin H. Bradley, Geoffrey W. Vickers
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294457
Poster Presentations
Yuanhe Song, Hong Zhao, Wenyi Chen, Yushan Tan
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294458
Xiaoyang Yu, Jian Zhang, Liying Wu, Xifu Qiang, Qing Lin
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294459
Wenyi Chen, Yongzhi Chen
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294460
3D Modeling Methods
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294462
Stereo, Focus and Interferometric Methods
Janusz A. Marszalec, Risto A. Myllylae
Proceedings Volume Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (1997) https://doi.org/10.1117/12.294463
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