PROCEEDINGS VOLUME 7310
SPIE DEFENSE, SECURITY, AND SENSING | 13-17 APRIL 2009
Non-Intrusive Inspection Technologies II
Editor Affiliations +
IN THIS VOLUME

4 Sessions, 10 Papers, 0 Presentations, 0 Posters
Proceedings Volume 7310 is from: Logo
SPIE DEFENSE, SECURITY, AND SENSING
13-17 April 2009
Orlando, Florida, United States
Front Matter: Volume 7310
Proceedings Volume Non-Intrusive Inspection Technologies II, 731001 (2009) https://doi.org/10.1117/12.832719
Remote Sensing
S. Watchorn, J, Noto, J. Anderson, C, E. Sioris
Proceedings Volume Non-Intrusive Inspection Technologies II, 731002 (2009) https://doi.org/10.1117/12.818670
Michael V. Hynes, Maurice Toolin, Bernard Harris, John McElroy, Mark S. Wallace, Larry J. Schultz, Mark Galassi, Andrew Hoover, Michal Mocko, et al.
Proceedings Volume Non-Intrusive Inspection Technologies II, 731003 (2009) https://doi.org/10.1117/12.818735
Proceedings Volume Non-Intrusive Inspection Technologies II, 731004 (2009) https://doi.org/10.1117/12.820798
Inspection Hardware and Materials
Yuriy Zorenko, Vitaliy Gorbenko, Taras Voznyak, Thierry Martin, Paul-Antoine Douissard, Jiri A. Mares, Martin Nikl
Proceedings Volume Non-Intrusive Inspection Technologies II, 731007 (2009) https://doi.org/10.1117/12.818125
M. Nikl, J. Tous, J. A. Mares, P. Prusa, E. Mihokova, K. Blazek, A. Vedda, Yu. Zorenko, V. Gorbenko, et al.
Proceedings Volume Non-Intrusive Inspection Technologies II, 731008 (2009) https://doi.org/10.1117/12.818358
Inspection Methodologies and CONOPS
Holger M. Jaenisch, James W. Handley, Kristina L. Jaenisch R.N., Nathaniel G. Albritton
Proceedings Volume Non-Intrusive Inspection Technologies II, 73100B (2009) https://doi.org/10.1117/12.817835
Karan D. Mohan, M. Amir Khan, Amin N. Dharamsi
Proceedings Volume Non-Intrusive Inspection Technologies II, 73100C (2009) https://doi.org/10.1117/12.818574
Daniel Wakeford, H. R. Andrews, E. T. H. Clifford, Liqian Li, Nick Bray, Darren Locklin, Michael V. Hynes, Maurice Toolin, Bernard Harris, et al.
Proceedings Volume Non-Intrusive Inspection Technologies II, 73100D (2009) https://doi.org/10.1117/12.818770
E. J. Cook, J. A. Griffiths, M. Koutalonis, C. Gent, S. Pani, J. A. Horrocks, L. George, S. Hardwick, R. Speller
Proceedings Volume Non-Intrusive Inspection Technologies II, 73100I (2009) https://doi.org/10.1117/12.819132
Back to Top