Phase-shifting projected fringe profilometry using ternary-encoded patterns

Sih-Yue Chen; Nai-Jen Cheng; Wei-Hung Su

doi:10.1117/12.2275325

23 August 2017 Phase-shifting projected fringe profilometry using ternary-encoded patterns

Sih-Yue Chen, Nai-Jen Cheng, Wei-Hung Su

Proceedings Volume 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI; 103820U (2017) https://doi.org/10.1117/12.2275325
Event: SPIE Optical Engineering + Applications, 2017, San Diego, California, United States

Abstract

A fringe projection profilometry is presented. It uses the phase-shifting technique perform the phase-extraction and use the ternary-encoded patterns to identify the fringe orders. Only five-shot measurements are required for data processing. Experiments show that absolute phases could be obtained with high reliability.

Conference Presentation

Citation Download Citation

Sih-Yue Chen, Nai-Jen Cheng, and Wei-Hung Su "Phase-shifting projected fringe profilometry using ternary-encoded patterns", Proc. SPIE 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI, 103820U (23 August 2017); https://doi.org/10.1117/12.2275325

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