Prof. Nai-Jen Cheng
Assistant Professor at National Kaohsiung Univ of Science and Technology
SPIE Involvement:
Author
Publications (25)

Proceedings Article | 5 October 2023 Poster + Paper
Proceedings Volume 12682, 126820D (2023) https://doi.org/10.1117/12.2677325
KEYWORDS: Inspection, 3D projection, Fringe analysis, Image acquisition, 3D metrology, 3D acquisition, 3D image processing, Amplitude modulation, Discontinuities

Proceedings Article | 3 October 2022 Presentation + Paper
Proceedings Volume 12229, 1222909 (2022) https://doi.org/10.1117/12.2632370
KEYWORDS: Phase shifts, Binary data, Fringe analysis, Inspection, Reflectivity, Projection systems, Imaging arrays, Image sensors, Calibration, 3D metrology

Proceedings Article | 20 August 2020 Poster + Paper
Proceedings Volume 11498, 114980X (2020) https://doi.org/10.1117/12.2572296
KEYWORDS: Fourier transforms, Inspection, Fringe analysis, Image sensors, 3D metrology

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11123, 111230W (2019) https://doi.org/10.1117/12.2530716
KEYWORDS: Inspection, Source mask optimization, CCD cameras, Reflectivity, Image sensors, Imaging arrays, 3D metrology, Fringe analysis, Modulation, Image filtering

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11123, 111230U (2019) https://doi.org/10.1117/12.2530714
KEYWORDS: Phase shifts, Fringe analysis, 3D metrology, Inspection, Phase measurement, Adaptive optics, Bromine, Calibration, Projection systems, CCD cameras

Showing 5 of 25 publications
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