Error analysis and correction method of axial multi-intensity phase retrieval imaging

Hao Yan; Qikai Shi; Baojian Ji; Shenglin Wen

doi:10.1117/12.2585441

4 December 2020 Error analysis and correction method of axial multi-intensity phase retrieval imaging

Hao Yan, Qikai Shi, Baojian Ji, Shenglin Wen

Proceedings Volume 11617, International Conference on Optoelectronic and Microelectronic Technology and Application; 1161739 (2020) https://doi.org/10.1117/12.2585441
Event: International Conference on Optoelectronic and Microelectronic Technology and Application, 2020, Nanjing, China

Abstract

For lens-free imaging technology based on axial multi-plane phase retrieval, the test parameters have a very important impact on the image reconstruction speed and quality. The deviations between the actual position of the recorded diffraction intensity pattern and the set position in the reconstruction algorithm will also affect the image reconstruction quality. We analyzed the influence of test parameters and deviations on the reconstruction accuracy and proposed a method to correct the position mismatch of the intensity image. The effectiveness of the method is verified by simulation and experiment.

Citation Download Citation

Hao Yan, Qikai Shi, Baojian Ji, and Shenglin Wen "Error analysis and correction method of axial multi-intensity phase retrieval imaging", Proc. SPIE 11617, International Conference on Optoelectronic and Microelectronic Technology and Application, 1161739 (4 December 2020); https://doi.org/10.1117/12.2585441

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