Presentation + Paper
31 August 2022 Development of Bragg reflection-type x-ray polarimeter based on a bent silicon crystal using hot plastic deformation
Author Affiliations +
Abstract
We are developing a novel Bragg reflection x-ray polarimeter using hot plastic deformation of silicon wafers. A Bragg reflection polarimeter has the advantage of simple principle and large modulation factor but suffers from the disadvantage of a narrow detectable energy band and difficulty to focus an incident beam. We overcome these disadvantages by bending a silicon wafer at high temperature. The bent Bragg reflection polarimeter have a wide energy band using different angles on the wafer and enable focusing. We have succeeded in measuring x-ray polarization with this method for the first time using a sample optic made from a 4-inch silicon (100) wafer.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. Ueda, T. Uchino, D. Ishi, Y. Ezoe, K. Ishikawa, M. Numazawa, A. Fukushima, S. Sakuda, A. Inagaki, H. Morishita, L. Sekiguchi, T. Murakawa, Y. Tsuji, K. Mitsuda, K. Morishita, and K. Nakajima "Development of Bragg reflection-type x-ray polarimeter based on a bent silicon crystal using hot plastic deformation", Proc. SPIE 12181, Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, 121812O (31 August 2022); https://doi.org/10.1117/12.2629635
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KEYWORDS
X-rays

Silicon

Semiconducting wafers

Modulation

Polarization

Reflection

X-ray astronomy

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