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Prof. Kazuo Nakajima
at Tohoku Univ.
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Publications (1)
Proceedings Article | 31 August 2022 Presentation + Paper
Development of Bragg reflection-type x-ray polarimeter based on a bent silicon crystal using hot plastic deformation
Y. Ueda, T. Uchino, D. Ishi, Y. Ezoe, K. Ishikawa, M. Numazawa, A. Fukushima, S. Sakuda, A. Inagaki, H. Morishita, L. Sekiguchi, T. Murakawa, Y. Tsuji, K. Mitsuda, K. Morishita, K. Nakajima
Proceedings Volume 12181, 121812O (2022) https://doi.org/10.1117/12.2629635
KEYWORDS: X-rays, Silicon, Semiconducting wafers, Modulation, Polarization, Reflection, X-ray astronomy
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