Low-coherence optical reflectometry of laser diode waveguides

Christian Yves Boisrobert; Douglas L. Franzen; Bruce L. Danielson; David H. Christensen

doi:10.1117/12.44935

1 September 1991 Low-coherence optical reflectometry of laser diode waveguides

Christian Yves Boisrobert, Douglas L. Franzen, Bruce L. Danielson, David H. Christensen

Proceedings Volume 1474, Optical Technology for Signal Processing Systems; (1991) https://doi.org/10.1117/12.44935
Event: Orlando '91, 1991, Orlando, FL, United States

Abstract

Laser diode waveguides are probed using low coherence optical reflectometry. Reflections from the launch optics, front facet, and rear facet are located with a resolution of approximately 10 micrometers . Diodes mounted in pigtailed packages and on chip carriers have been studied.

Citation Download Citation

Christian Yves Boisrobert, Douglas L. Franzen, Bruce L. Danielson, and David H. Christensen "Low-coherence optical reflectometry of laser diode waveguides", Proc. SPIE 1474, Optical Technology for Signal Processing Systems, (1 September 1991); https://doi.org/10.1117/12.44935

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