Paper
1 December 1991 Characterization of hot-isostatic-pressed optical-quality beryllium
Jerry L. Behlau, Mark Baumler
Author Affiliations +
Abstract
Producibility of low scatter, HIPed beryllium optics requires the manufacturer to know more than just the surface roughness or BRDF of his parts in work. The limitations of his test apparatus (spatial frequency range, height resolution, steepness of slopes, polarization sensitivity, available wavelengths) require that `overlapping' data be taken. This doesn't just mean that the `same' data needs to be taken on similar instruments. Instead, a collection of both quantitative and qualitative data from different types of analysis equipment must be combined to form a more complete picture of the interactions between the material and the wavelengths of interest. This paper discusses the results from several different tests which (when combined) give the manufacturer enough information to determine whether or not there is any more that can be done in his shop to improve the scatter function. We demonstrate that a variety of objective and subjective testing is necessary to determine the `true' characteristics of uncoated HIPed beryllium mirrors. We show results of testing, give a discussion on the interpretation of the data and demonstrate how it was used to optimize production results.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jerry L. Behlau and Mark Baumler "Characterization of hot-isostatic-pressed optical-quality beryllium", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); https://doi.org/10.1117/12.50510
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Beryllium

Bidirectional reflectance transmission function

Polishing

Surface roughness

Carbon

Oxides

Polarization

RELATED CONTENT

Beryllium scatter analysis program
Proceedings of SPIE (December 01 1991)
Lessons learned in recent beryllium-mirror fabrication
Proceedings of SPIE (September 01 1991)
Visible scatter measurements of various materials
Proceedings of SPIE (December 01 1990)
Fully automated angle resolved scatterometer
Proceedings of SPIE (September 30 1994)

Back to Top