Real-time infrared test set: assessment and characterization

H. Ronald Marlin; Richard L. Bates; Miles H. Sweet; Rowena M. Carlson; R. Barry Johnson; Diehl H. Martin; Ronald Chung; Jon C. Geist; Michael Gaitan; Charles D. Mulford; Eugene S. Zakar; Robert J. Zeto; Russ Olson; Gordon C. Perkins

doi:10.1117/12.280947

15 July 1997 Real-time infrared test set: assessment and characterization

H. Ronald Marlin, Richard L. Bates, Miles H. Sweet, Rowena M. Carlson, R. Barry Johnson, Diehl H. Martin, Ronald Chung, Jon C. Geist, Michael Gaitan, Charles D. Mulford, Eugene S. Zakar, Robert J. Zeto, Russ Olson, Gordon C. Perkins

Author Affiliations +

Proceedings Volume 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II; (1997) https://doi.org/10.1117/12.280947
Event: AeroSense '97, 1997, Orlando, FL, United States

Abstract

During the past several years, the technology for designing and fabricating thermal pixel arrays (TPAs) using silicon micromachined CMOS devices has been developed to support the development of a real-time infrared test set (RTIR) for sensors and seekers. The TPA is a custom application- specific integrated circuit device that is fabricated using a low-cost commercial CMOS process. The RTIR is a compact, self-contained test instrument that is intended for test and evaluation of infrared systems in the field. This paper describes characterization of TPA pixels, including directional radiant intensity distribution, spatial radiance distribution, temperature distribution, cross talk, spectral radiance, air pressure effects, and rise and fall times.

Citation Download Citation

H. Ronald Marlin, Richard L. Bates, Miles H. Sweet, Rowena M. Carlson, R. Barry Johnson, Diehl H. Martin, Ronald Chung, Jon C. Geist, Michael Gaitan, Charles D. Mulford, Eugene S. Zakar, Robert J. Zeto, Russ Olson, and Gordon C. Perkins "Real-time infrared test set: assessment and characterization", Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); https://doi.org/10.1117/12.280947

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available