Semiconductor multiple-electrode detectors for measuring ionizing radiation at room temperature

Clinton L. Lingren; Boris A. Apotovsky; Jack F. Butler; Richard L. Conwell; F. Patrick Doty; Stan J. Friesenhahn; A. Oganesyan; Bo Pi; S. Zhao

doi:10.1117/12.277670

7 July 1997 Semiconductor multiple-electrode detectors for measuring ionizing radiation at room temperature

Clinton L. Lingren, Boris A. Apotovsky, Jack F. Butler, Richard L. Conwell, F. Patrick Doty, Stan J. Friesenhahn, A. Oganesyan, Bo Pi, S. Zhao

Author Affiliations +

Proceedings Volume 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications; (1997) https://doi.org/10.1117/12.277670
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

Researchers at Digirad Corporation have developed an innovative method for eliminating the effects of hole trapping in radiation detectors made from compound semiconductors such as CdTe or CdZnTe. The technique involves no additional electronics. Working devices have been manufactured in a variety of configurations including imaging arrays. This paper presents results from some simple structures.

Citation Download Citation

Clinton L. Lingren, Boris A. Apotovsky, Jack F. Butler, Richard L. Conwell, F. Patrick Doty, Stan J. Friesenhahn, A. Oganesyan, Bo Pi, and S. Zhao "Semiconductor multiple-electrode detectors for measuring ionizing radiation at room temperature", Proc. SPIE 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, (7 July 1997); https://doi.org/10.1117/12.277670

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