Modeling and test of pixel cross-talk in HgCdTe focal plane arrays

Thomas J. Sanders; E. Lee Caraway; Glenn T. Hess; Gwendolyn W. Newsome; Theodore Fischer

doi:10.1117/12.445348

10 October 2001 Modeling and test of pixel cross-talk in HgCdTe focal plane arrays

Thomas J. Sanders, E. Lee Caraway, Glenn T. Hess, Gwendolyn W. Newsome, Theodore Fischer

Proceedings Volume 4369, Infrared Technology and Applications XXVII; (2001) https://doi.org/10.1117/12.445348
Event: Aerospace/Defense Sensing, Simulation, and Controls, 2001, Orlando, FL, United States

Abstract

Mercury Cadmium Telluride focal plane arrays with well over 1000 pixels have been fabricated for a number of years. These FPA's have been built as large two-dimensional arrays of HgCdTe p-n junction diodes on a single CdTe or CdZnTe substrate. Sensitivity of each pixel to impinging radiation is one of the most important quality factors for these devices. However, material parameters, which give diode high sensitivity, are the same as those that cause cross talk between adjacent diodes in the array. This cross talk causes a blurred image and in general is a detrimental factor for the FPA system. The cross talk modeling is done in a two- dimensional simulation format to achieve high accuracy. In addition, the output information can be generated as a statistical function of the material and design parameter variations. Actual heterojunction FPA devices have been fabricated and tested for cross talk. In the paper, this data is compared to the simulation results. This design method and its algorithms are encapsulated in a software program called IRSIM. This physics-based simulator allows the engineer to use versatile geometries and material concentrations.

Citation Download Citation

Thomas J. Sanders, E. Lee Caraway, Glenn T. Hess, Gwendolyn W. Newsome, and Theodore Fischer "Modeling and test of pixel cross-talk in HgCdTe focal plane arrays", Proc. SPIE 4369, Infrared Technology and Applications XXVII, (10 October 2001); https://doi.org/10.1117/12.445348

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