Paper
2 August 2004 A white-light profiling algorithm adopting the multiwavelength interferometric technique
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Abstract
A new profiling algorithm is proposed for the scanning white-light interferometry. A series of white-light interferograms are acquired by traditional vertical scanning process. The collected intensity data of the interferograms are then Fourier-Transformed with respect to the ordinate, or the scanning axis, into the wave number domain, where two or more wave numbers are selected for further calculation. The multi-wavelength phase-unwrapping technique is then used to solve for the surface profile. Preliminary experiment has been carried out with a Mirau-type white-light interferometer on two sets of step-height standards. The proposed algorithm works as well even when the spectrum of the white-light source is not Gaussian distributed, while the conventional peak sensing algorithms do not.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hua-Chen Hsu, Chi-Hong Tung, Ching-Fen Kao, and Calvin C. Chang "A white-light profiling algorithm adopting the multiwavelength interferometric technique", Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); https://doi.org/10.1117/12.559251
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Cited by 5 scholarly publications.
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KEYWORDS
Beam splitters

Interferometry

Light sources

Profiling

Phase interferometry

Interferometers

Objectives

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