FEL beam metrology with a gas-monitor detector

Alexander Gottwald; SergeJ V. Bobashev; Ulrich Hahn; Arne Hoehl; Ulf Jastrow; Mathias Richter; Andrej A. Sorokin; Kai I. Tiedtke

doi:10.1117/12.556289

10 November 2004 FEL beam metrology with a gas-monitor detector

Alexander Gottwald, SergeJ V. Bobashev, Ulrich Hahn, Arne Hoehl, Ulf Jastrow, Mathias Richter, Andrej A. Sorokin, Kai I. Tiedtke

Author Affiliations +

Proceedings Volume 5534, Fourth Generation X-Ray Sources and Optics II; (2004) https://doi.org/10.1117/12.556289
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

For the determination of absolute photon fluxes from high-intense, pulsed VUV and soft X-ray sources like free-electron lasers, a gas-monitor detector system based on the photoionization of rare gases was developed. A prototype system was successfully used for the characterization of VUV free-electron laser radiation at the TESLA test facility (phase 1) in Hamburg. Pulse-resolved measurements at peak powers of more than 100 MW at a wavelength of 87 nm were demonstrated. In order to provide a photon-beam diagnostic of VUV-FEL radiation during phase 2 of the TTF project, a set of four new detectors has been constructed, based on the prototype. The new detector system can be used not only for intensity measurement and monitoring, but also for measuring the beam position. The detector set was calibrated in the Radiometry Laboratory of the Physikalisch-Technische Bundesanstalt at the electron storage ring BESSY II. The calibration was performed using spectrally-dispersed synchrotron radiation at low intensities and a semiconductor photodiode as a transfer standard.

Citation Download Citation

Alexander Gottwald, SergeJ V. Bobashev, Ulrich Hahn, Arne Hoehl, Ulf Jastrow, Mathias Richter, Andrej A. Sorokin, and Kai I. Tiedtke "FEL beam metrology with a gas-monitor detector", Proc. SPIE 5534, Fourth Generation X-Ray Sources and Optics II, (10 November 2004); https://doi.org/10.1117/12.556289

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available