Paper
20 January 2005 Super oblique incidence interferometer by using antireflection prism with subwavelength structure
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Abstract
A super oblique incidence interferometer is proposed by using an anti-reflection prism with sub-wavelength structure. Since the sensitivity of interferogram depends on incident angle it can be achieved lower than ordinary interferometer. A sub-wavelength structure on the prism works an increasing transmittance under the condition of the vicinity of critical angle. A shape of this structure is a triangle with sub-wavelength order of height and width periodically and works matching a difference reflective index between prism and air. The experimental results of transmittance are agreed well with the calculated results by the rigorous coupled wave analysis. Its incident angle of the oblique interferogram can be achieved at 86 degrees. Simulation and experimental results are shown.
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Yasuhiro Mizutani, Yukitoshi Otani, and Norihiro Umeda "Super oblique incidence interferometer by using antireflection prism with subwavelength structure", Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); https://doi.org/10.1117/12.577047
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KEYWORDS
Prisms

Transmittance

Interferometers

Refractive index

Antireflective coatings

Reflectivity

Silicon

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