Paper
9 February 2005 Fabrication of soft nanoimprint stamps and polymer subwavelength gratings by spin coating techniques
Yoshiaki Kanamori, Emmanuel Roy, Yong Chen
Author Affiliations +
Abstract
We report on a fabrication technique of both soft nanoimprint stamps and sub-wavelength gratings (SWGs) by spin coating of a polymer solution on a silicon mold. One and two-dimensional grating structures of periods 200nm were first obtained by high-resolution electron beam lithography and reactive ion etching of a silicon wafer. Then, a solution of polymethyl methacrylate (PMMA) was spun coated on the etched silicon molds. After baking, a thin layer of polydimethylsiloxane (PDMS) was assembled with PMMA sheet and mounted on a glass carrier. Scanning electron microscopy images of the replicated samples show high quality features reproduced from the silicon mold. Since PMMA is transparent for visible and near-infrared wavelengths, the replicated subwavelength gratings are applicable for many kinds of optical devices. In addition, the fabricated structure can be used as soft nanoimprint stamps which provides clear advantages of large surface patterning. The optical properties of both two and one-dimensional SWGs have been studied theoretically based on rigorous coupled-wave analysis (RCWA). The measured transmittance of the replicated antireflection SWG agreed well with the theoretical calculations.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoshiaki Kanamori, Emmanuel Roy, and Yong Chen "Fabrication of soft nanoimprint stamps and polymer subwavelength gratings by spin coating techniques", Proc. SPIE 5635, Nanophotonics, Nanostructure, and Nanometrology, (9 February 2005); https://doi.org/10.1117/12.571986
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Cited by 1 scholarly publication and 2 patents.
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KEYWORDS
Polymethylmethacrylate

Silicon

Nanoimprint lithography

Transmittance

Antireflective coatings

Fabrication

Optical testing

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