Paper
9 June 2006 Study of high transmittance shield film for microwave sulfur light
Xinhua Fu, Lianhe Dong, Peng Lu, Weibo Duan, Xiumin Li
Author Affiliations +
Proceedings Volume 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 61492Y (2006) https://doi.org/10.1117/12.674301
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China
Abstract
The line width and period of the shield film were designed and optimized based on the principle of microwave transmission. The photolithography technology has been used to generate a photo mask. Then the mask was duplicated on the anti-refection coated fused silica substrate by adding metal and protective coatings with RF sputtering technology, followed by photoresist removing and other procedures. Finally, a high precision and dense metal shield film were developed on the substrate. A transmission of about 97% has been tested in the final result. A surface resistance of 30Ω/square has also been obtained. The microwave of 2.45GHZ has been completely shielded from radiation.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xinhua Fu, Lianhe Dong, Peng Lu, Weibo Duan, and Xiumin Li "Study of high transmittance shield film for microwave sulfur light", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61492Y (9 June 2006); https://doi.org/10.1117/12.674301
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Microwave radiation

Metals

Sulfur

Photoresist materials

Transmittance

Antireflective coatings

Silica

Back to Top