Paper
15 June 2006 Temperature dependence of charge transfer inefficiency in Chandra x-ray CCDs
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Abstract
Soon after launch, the Advanced CCD Imaging Spectrometer (ACIS), one of the focal plane instruments on the Chandra X-ray Observatory, suffered radiation damage from exposure to soft protons during passages through the Earth's radiation belts. The primary effect of the damage was to increase the charge transfer inefficiency (CTI) of the eight front illuminated CCDs by more than two orders of magnitude. The ACIS instrument team is continuing to study the properties of the damage with an emphasis on developing techniques to mitigate CTI and spectral resolution degradation. We present the initial temperature dependence of ACIS CTI from -120 to -60 degrees Celsius and the current temperature dependence after more than six years of continuing slow radiation damage. We use the change of shape of the temperature dependence to speculate on the nature of the damaging particles.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. E. Grant, M. W. Bautz, S. E. Kissel, B. LaMarr, and G. Y. Prigozhin "Temperature dependence of charge transfer inefficiency in Chandra x-ray CCDs", Proc. SPIE 6276, High Energy, Optical, and Infrared Detectors for Astronomy II, 62761O (15 June 2006); https://doi.org/10.1117/12.672019
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Cited by 9 scholarly publications.
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KEYWORDS
Charge-coupled devices

Particles

Bismuth

X-rays

Data modeling

Temperature metrology

Error analysis

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