Paper
29 April 2008 Sign magnetosensitivity of dual-collector lateral bipolar magnetotransistor
R. D. Tikhonov
Author Affiliations +
Proceedings Volume 7025, Micro- and Nanoelectronics 2007; 70251B (2008) https://doi.org/10.1117/12.802486
Event: Micro- and Nanoelectronics 2007, 2007, Zvenigorod, Russian Federation
Abstract
The dual collector lateral bipolar magnetotransistor manufactured in the well with an external connection of contacts to the well and substrate has been investigated. Modern methods of device-technological simulation have been used to model the distribution of charge carriers, current densities, and recombination velocity. It is shown that bipolar magnetotransistor in the well have negative relative magnetic sensitivity due to the volumetric recombination mechanism.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. D. Tikhonov "Sign magnetosensitivity of dual-collector lateral bipolar magnetotransistor", Proc. SPIE 7025, Micro- and Nanoelectronics 2007, 70251B (29 April 2008); https://doi.org/10.1117/12.802486
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Magnetism

Electrons

Resistance

Diffusion

Transistors

Magnetic semiconductors

Semiconductors

Back to Top