Ultra low capacitance high frequency IC probe

M. E. Jacob; D. A. Miller; L. Forbes

doi:10.1117/12.792137

9 September 2008 Ultra low capacitance high frequency IC probe

M. E. Jacob, D. A. Miller, L. Forbes

Proceedings Volume 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II; 704203 (2008) https://doi.org/10.1117/12.792137
Event: NanoScience + Engineering, 2008, San Diego, California, United States

Abstract

The high speed low capacitance probe presented here is a flexible / tailorable tool for internal node testing on Radio Frequency Integrated Circuits (RFIC). The probe utilizes the mutual capacitive coupling between two wires. In this case, a tungsten whisker and the inner conductor of a coaxial cable forms a capacitor, enabling extremely low probing (loading) capacitance. The mutual capacitance which can be modeled to the first order as a lumped element capacitor provides differentiating action. Viewing the derivative of the output signal, rise time and can be observed directly. Through the use of probe calibration and Fourier transforms the probed signal can be re-created. Probe calibration develops a transfer function enabling re-creation of time domain signals.

Citation Download Citation

M. E. Jacob, D. A. Miller, and L. Forbes "Ultra low capacitance high frequency IC probe", Proc. SPIE 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II, 704203 (9 September 2008); https://doi.org/10.1117/12.792137

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