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Dr. Leonard Forbes
at L Forbes and Associates
SPIE Involvement:
Author
Publications (6)
Proceedings Article | 21 August 2009 Paper
Characterization of single electron effects in nanoscale MOSFETs
Leonard Forbes, Drake Miller
Proceedings Volume 7402, 74020H (2009) https://doi.org/10.1117/12.825169
KEYWORDS: Field effect transistors, Oxides, Chemical species, Interfaces, Signal processing, Interference (communication), Instrument modeling, Silicon, 3D modeling, Molybdenum
Proceedings Article | 9 September 2008 Paper
Ultra low capacitance high frequency IC probe
M. Jacob, D. Miller, L. Forbes
Proceedings Volume 7042, 704203 (2008) https://doi.org/10.1117/12.792137
KEYWORDS: Capacitance, Capacitors, Tungsten, Fourier transforms, Calibration, Capacitive coupling, 3D modeling, Integrated circuits, Advanced distributed simulations, Device simulation
Proceedings Article | 23 May 2005 Paper
Analysis and simulation of noise in correlated double sampling imager circuits
Leonard Forbes, Harish Gopalakrishnan, Weetit Wanalertlak
Proceedings Volume 5844, (2005) https://doi.org/10.1117/12.608761
KEYWORDS: Device simulation, Cadmium sulfide, Imaging systems, Thermal modeling, Thermal effects, Transistors, Clocks, Switches, Computer simulations, Low light imagers
Proceedings Article | 23 May 2005 Paper
MOSFET 1/f noise under switched bias conditions
Michael Louie, L. Forbes
Proceedings Volume 5844, (2005) https://doi.org/10.1117/12.608763
KEYWORDS: Switching, Field effect transistors, Transistors, Spectrum analysis, Amplifiers, Interference (communication), Analog electronics, Phase shift keying, Device simulation, Modulation
Proceedings Article | 12 May 2003 Paper
1/f noise and clock jitter in digital electronic systems
Leonard Forbes, C.W. Zhang
Proceedings Volume 5113, (2003) https://doi.org/10.1117/12.488153
KEYWORDS: Oscillators, Silicon, Clocks, Digital electronics, Transistors, Interference (communication), Device simulation, CMOS devices, MATLAB, Amplifiers
Showing 5 of 6 publications
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Conference Committee Involvement (3)
Noise in Devices and Circuits III
24 May 2005 | Austin, Texas, United States
Noise in Devices and Circuits II
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Noise in Devices and Circuits
2 June 2003 | Santa Fe, New Mexico, United States
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