Paper
30 August 2013 Extracting of removal function in CCOS based on edge detection algorithm
Jian Liu, Shaozhi Wang, Linghua Zhang, Huanan Chen
Author Affiliations +
Proceedings Volume 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications; 89101D (2013) https://doi.org/10.1117/12.2034331
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China
Abstract
In order to realize removal function model building with high precision in computer controlled optical polishing process, a kind of new algorithm is proposed in this paper, which was based on edge detection technology. The algorithm preprocesses the interferometric metrology result and inverts it into digital image data at first. And then the Canny edge detecting operator and Hough transform are used to detect and extract the image edge. At last the boundary of the removal function was acquired. The center of removal function boundary was allocated quickly in this algorithm, which was assisted with the particularly center position. It reduced a lot of blind calculation for the target center of circle accumulating counts. At last, the experiment result indicated the algorithm in this paper could be used in removal function modeling and dwell time optimization solving.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jian Liu, Shaozhi Wang, Linghua Zhang, and Huanan Chen "Extracting of removal function in CCOS based on edge detection algorithm", Proc. SPIE 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications, 89101D (30 August 2013); https://doi.org/10.1117/12.2034331
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Edge detection

Detection and tracking algorithms

Hough transforms

Image processing

Interferometry

Data conversion

Polishing

Back to Top