Presentation
16 March 2023 Multiplexed dielectric tensor tomography for cost-effective and robust dielectric tensor reconstruction (Conference Presentation)
Author Affiliations +
Proceedings Volume PC12389, Quantitative Phase Imaging IX; PC123890Q (2023) https://doi.org/10.1117/12.2653738
Event: SPIE BiOS, 2023, San Francisco, California, United States
Abstract
The dielectric tensor is a physical quantity which characterizes birefringent materials with principal refractive indices and orientations of optic axes. Recently, three-dimensional dielectric tensor distribution was directly measured using dielectric tensor tomography (DTT). However, since the original DTT uses two cameras to acquire polarization-sensitive fields, position disagreement between the two fields deteriorates reconstruction quality. Here, we present multiplexed DTT using only one camera. To avoid the position disagreement, we exploit holographic multiplexing, interfering two orthogonally polarized reference beams with a sample beam on the camera. We validate the present method via measurement of anisotropic structures in liquid crystal particles.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juheon Lee, Seungwoo Shin, Herve Hugonnet, and YongKeun Park "Multiplexed dielectric tensor tomography for cost-effective and robust dielectric tensor reconstruction (Conference Presentation)", Proc. SPIE PC12389, Quantitative Phase Imaging IX, PC123890Q (16 March 2023); https://doi.org/10.1117/12.2653738
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KEYWORDS
Dielectrics

Multiplexing

Tomography

Cameras

3D metrology

Refractive index

Microscopy

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