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19 June 2024 No-reference metrics for the characterization of experimental artifacts in fluorescence microscopy
Elena Corbetta, Thomas Bocklitz
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Proceedings Volume PC13011, Data Science for Photonics and Biophotonics; PC1301107 (2024) https://doi.org/10.1117/12.3015933
Event: SPIE Photonics Europe, 2024, Strasbourg, France
Abstract
Optical microscopy is widely applied to the investigation of biomedical samples, and a variety of image processing approaches have been established to reduce artifacts generated by the measurement process. However, a standardized and reliable method for assessing image quality is still lacking. Our study contributes to the investigation of image evaluation methods for fluorescence microscopy. We present a set of no-reference metrics that can be used for the characterization of experimental artifacts. In addition, our method is incorporated into a machine learning approach for automatic classification of single artifacts. The metrics identify reliable markers for single artifacts in fluorescence microscopy measurements, can be easily interpreted, and allow the selection of the best image based on specific quality requirements. Our study provides a simple evaluation tool for optical microscopy that can also be extended to the different stages of the processing pipeline.
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Elena Corbetta and Thomas Bocklitz "No-reference metrics for the characterization of experimental artifacts in fluorescence microscopy", Proc. SPIE PC13011, Data Science for Photonics and Biophotonics, PC1301107 (19 June 2024); https://doi.org/10.1117/12.3015933
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KEYWORDS
Fluorescence microscopy
Signal to noise ratio
Image analysis
Image quality
Optical microscopy
Vignetting
Interference (communication)
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