Inelastic electron-light scattering is a powerful tool for investigating optical properties on the nanoscale in an ultrafast transmission electron microscope. Combining electron microscopy with integrated photonics, the requirement of pulsed laser and electron sources can be overcome. In this talk, we demonstrate the spatial and spectral characterization of the intracavity field of a photonic chip-based, high-Q silicon nitride microresonator utilizing free electron-light interaction. By combining optical and electron spectroscopies, we moreover probe the emergence of various nonlinear intracavity states. This novel combination of nonlinear integrated photonics and electron microscopy promises new schemes in electron beam manipulation as well as electron-based probing of optical microresonator states.
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