Dr. Arturo Fernandez Madrigal
Head of Department at Ctr de Investigación en Energia
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 August 2010 Paper
Proceedings Volume 7770, 77701D (2010) https://doi.org/10.1117/12.860829
KEYWORDS: Gallium nitride, Thin films, Semiconductors, Electrodes, Hydrogen, Thin film growth, X-ray diffraction, Scanning electron microscopy, Hydrogen production, Oxides

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