Badri N. Tiwari
at Univ of Notre Dame
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 1 February 2003
OE, Vol. 42, Issue 02, (February 2003) https://doi.org/10.1117/12.10.1117/1.1532332
KEYWORDS: Field effect transistors, Signal to noise ratio, Resistance, Capacitance, Diffusion, Microwave radiation, Instrument modeling, Metals, Semiconductors, Optical engineering

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