Carolien Boeckx
at imec
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 24 March 2016 Paper
Proceedings Volume 9778, 977836 (2016) https://doi.org/10.1117/12.2219378
KEYWORDS: Metrology, Algorithm development, Software development, Data modeling, Image processing, Semiconductors, Scanning electron microscopy, Image analysis, Data analysis, Process control

Proceedings Article | 18 March 2016 Paper
Proceedings Volume 9776, 97761W (2016) https://doi.org/10.1117/12.2219876
KEYWORDS: Directed self assembly, Extreme ultraviolet, Optical lithography, Lithography, Extreme ultraviolet lithography, Logic, Scanners, Etching, Immersion lithography, Stochastic processes, Personal protective equipment, Photomasks, Scanning electron microscopy, Metrology

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