Chang Kyu Park
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 April 2020 Presentation
Proceedings Volume 11376, 113760W (2020) https://doi.org/10.1117/12.2558351
KEYWORDS: Ceramics, Capacitors, Velocity measurements, Failure analysis, Laser Doppler velocimetry, Sensors, Electronic components, Ferroelectric materials, Dielectrics, Electrical breakdown

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