Prof. Chang Yeol Ryu
at Rensselaer Polytechnic Institute
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 11 April 2016 Paper
Sungmin Park, Seongjun Jo, Yonghoon Lee, Chang Y. Ryu, Du Yeol Ryu, Jun Sung Chun
Proceedings Volume 9779, 977911 (2016) https://doi.org/10.1117/12.2221905
KEYWORDS: X-rays, Scattering, Reactive ion etching, Directed self assembly, Picosecond phenomena, Lithography, Silicon, Etching, Transmission electron microscopy, Annealing

Proceedings Article | 13 September 2007 Paper
Proceedings Volume 6658, 665812 (2007) https://doi.org/10.1117/12.734032
KEYWORDS: Crystals, Polymers, Chlorine, Field effect transistors, Thin films, Grazing incidence, Atomic force microscopy, Semiconductors, Annealing, Polymer thin films

Proceedings Article | 25 August 2006 Paper
Proceedings Volume 6336, 63360B (2006) https://doi.org/10.1117/12.679428
KEYWORDS: Crystals, Thin films, Grazing incidence, Medium wave, Molecules, Atomic force microscopy, Semiconductors, Polymers, Organic semiconductors, Oxidation

Proceedings Article | 20 September 2005 Paper
Proceedings Volume 5940, 59400B (2005) https://doi.org/10.1117/12.614990
KEYWORDS: Crystals, Grazing incidence, Head-mounted displays, Thin films, Atomic force microscopy, Silicon, Self-assembled monolayers, Molecules, Reflection, Transistors

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