Dr. Chris G. Lowrie
Senior Engineer
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 13 February 2008 Paper
Christopher Lowrie, Susan Earles, M. de Fernandez
Proceedings Volume 6898, 68981F (2008) https://doi.org/10.1117/12.759323
KEYWORDS: Silicon, Reflectivity, Light scattering, Scattering, Image segmentation, Computer simulations, Image filtering, Holography, Scanning probe microscopy, Atomic force microscope

Proceedings Article | 13 February 2008 Paper
Christopher Lowrie, Susan Earles, M. de Fernandez
Proceedings Volume 6898, 689818 (2008) https://doi.org/10.1117/12.759198
KEYWORDS: Hydrogen, Sensors, Silicon, Palladium, Reflectivity, Silicon films, Thin films, Light scattering, Atomic force microscopy, Semiconducting wafers

Proceedings Article | 17 April 2006 Paper
Proceedings Volume 6247, 624715 (2006) https://doi.org/10.1117/12.661513
KEYWORDS: Neural networks, Signal processing, Neurons, Acoustics, Sensors, Feature extraction, Wavelets, Vector spaces, Signal analyzers, Independent component analysis

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top