Prof. Christian Hafner
Lecturer at ETH Zurich
SPIE Involvement:
Author
Publications (19)

Proceedings Article | 20 November 2012 Paper
Proceedings Volume 8564, 856416 (2012) https://doi.org/10.1117/12.981865
KEYWORDS: Electroluminescent displays, Waveguides, Plasmonic waveguides, Gold, Silver, Numerical analysis, Electromagnetism, Superposition, Plasmonics, Wave propagation

Proceedings Article | 21 September 2011 Paper
Proceedings Volume 8096, 809622 (2011) https://doi.org/10.1117/12.891056
KEYWORDS: Plasmonics, Dielectrics, Numerical analysis, Wave propagation, Dielectric polarization, Electromagnetism, Waveguides, Multilayers, Optical spheres, Silver

Proceedings Article | 23 May 2011 Paper
Proceedings Volume 8083, 808304 (2011) https://doi.org/10.1117/12.889851
KEYWORDS: Dielectrics, Silver, Waveguides, Free space, Dielectric polarization, Optical spheres, Wave propagation, Electromagnetism, Multilayers, Magnetism

Proceedings Article | 12 October 2010 Paper
Ludmila Raguin, Tatiana Samrowski, Christian Hafner
Proceedings Volume 7838, 783818 (2010) https://doi.org/10.1117/12.867777
KEYWORDS: Nanoparticles, Stars, Scattering, Nanostructures, Plasmonics, Gold, Near field, Optical properties, Near field optics, Metals

Proceedings Article | 3 June 2010 Paper
Patrick Leidenberger, Christian Hafner
Proceedings Volume 7729, 77291K (2010) https://doi.org/10.1117/12.853727
KEYWORDS: Near field scanning optical microscopy, Copper, Microwave radiation, Waveguides, Cladding, Microscopes, Optical fibers, Dielectrics, Visualization, Signal to noise ratio

Showing 5 of 19 publications
Conference Committee Involvement (6)
Modeling Aspects in Optical Metrology
26 June 2017 | Munich, Germany
Modeling Aspects in Optical Metrology V
23 June 2015 | Munich, Germany
Modeling Aspects in Optical Metrology IV
13 May 2013 | Munich, Germany
Modeling Aspects in Optical Metrology
23 May 2011 | Munich, Germany
Modeling Aspects in Optical Metrology
15 June 2009 | Munich, Germany
Showing 5 of 6 Conference Committees
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