Prof. Cor L. Claeys
Director Advanced Semiconductor Technologies at imec
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 8 January 2013 Paper
Nataliya Lukyanchikova, Nikolay Garbar, Valeriya Kudina, Alexander Smolanka, Eddy Simoen, Cor Claeys
Proceedings Volume 8700, 87000N (2013) https://doi.org/10.1117/12.2017358
KEYWORDS: Dielectrics, Oxides, Field effect transistors, Capacitance, Silicon, Silica, Solids, Nondestructive evaluation, Diagnostics

Proceedings Article | 25 May 2004 Paper
Proceedings Volume 5470, (2004) https://doi.org/10.1117/12.546971
KEYWORDS: Field effect transistors, Silicon, Resistance, Oxides, Semiconducting wafers, Transistors, Time metrology, Measurement devices, Semiconductor physics, Ionization

Proceedings Article | 25 May 2004 Paper
Proceedings Volume 5470, (2004) https://doi.org/10.1117/12.546962
KEYWORDS: CMOS technology, Oxides, Field effect transistors, Dielectrics, Transistors, Analog electronics, Switching, System on a chip, Denoising, Oscillators

Proceedings Article | 1 May 1994 Paper
Nico Ricquier, Ingrid Debusschere, Bart Dierickx, A. Alaerts, Jan Vlummens, Cor Claeys
Proceedings Volume 2172, (1994) https://doi.org/10.1117/12.172755
KEYWORDS: Amplifiers, Capacitors, Sensors, Imaging systems, Image resolution, Transistors, Machine vision, Photodiodes, Switches, Capacitance

Proceedings Article | 11 March 1994 Paper
Cor Claeys, Ingrid Debusschere, Nico Ricquier, Peter Seitz, Martin Stalder, Jeffrey Raynor, Graham Lang, Giuseppe Cilia, C. Cavanna, U. Muessigmann, A. Abele
Proceedings Volume 2183, (1994) https://doi.org/10.1117/12.171209
KEYWORDS: Inspection, Image sensors, Holograms, Zoom lenses, Fractal analysis, Image processing, Image resolution, Convolution, Mirrors, Digital holography

Showing 5 of 12 publications
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