Daniel C. Aiken
at US Naval Research Lab
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 12 May 2016 Paper
Daniel Aiken, Scott Ramsey, Troy Mayo, Samuel Lambrakos, Joseph Peak
Proceedings Volume 9855, 985509 (2016) https://doi.org/10.1117/12.2220040
KEYWORDS: Near infrared, Absorption, Camouflage, Short wave infrared radiation, Reflectivity, Prototyping, Diffuse reflectance spectroscopy, Tolerancing, Systems modeling, Rutherfordium, Analytical research, Dysprosium

Proceedings Article | 9 May 2016 Paper
S. Lambrakos, C. Yapijakis, D. Aiken, A. Shabaev, S. Ramsey, J. Peak
Proceedings Volume 9862, 98620L (2016) https://doi.org/10.1117/12.2220047
KEYWORDS: Absorption, Statistical analysis, Infrared signatures, Windows, Transparency, Hyperspectral imaging, Electromagnetism, Ultraviolet radiation, Infrared imaging, Infrared radiation, Chemical analysis, Databases, Analytical research, Environmental sensing, Prototyping

SPIE Journal Paper | 2 November 2015
Daniel Aiken, Scott Ramsey, Troy Mayo, Samuel Lambrakos, Joseph Edward Peak
OE, Vol. 54, Issue 11, 117101, (November 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.11.117101
KEYWORDS: Absorption, Dielectrics, Statistical analysis, Data modeling, Short wave infrared radiation, Error analysis, Reflectivity, Optical engineering, Oscillators, Optimization (mathematics)

Proceedings Article | 3 June 2015 Paper
Daniel Aiken, Scott Ramsey, Troy Mayo, James Bellemare, Samuel Lambrakos, Joseph Peak
Proceedings Volume 9482, 948217 (2015) https://doi.org/10.1117/12.2087061
KEYWORDS: Data modeling, Statistical analysis, Dielectrics, Oscillators, Statistical modeling, Analytical research, Reflectivity, Mathematical modeling, Error analysis, Composites

Proceedings Article | 21 May 2015 Paper
S. Lambrakos, C. Yapijakis, D. Aiken, A. Shabaev, S. Ramsey, J. Peak
Proceedings Volume 9472, 947216 (2015) https://doi.org/10.1117/12.2177969
KEYWORDS: Statistical analysis, Absorption, Chemical analysis, Databases, Modulation, Analytical research, Systems modeling, Prototyping, Environmental sensing, Statistical modeling

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