Eric Burkam
Development Manager at Engis Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 October 2015 Paper
Benjamin Rosczyk, Eric Burkam, Artem Titov, Clement Onyenemezu, Ion Benea
Proceedings Volume 9633, 963306 (2015) https://doi.org/10.1117/12.2195559
KEYWORDS: Particles, Diamond, Silicon carbide, Image analysis, Surface finishing, Radium, Surface roughness, Abrasives, Shape analysis, Polishing

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