Dr. François A. Polack
SPIE Involvement:
Author
Publications (13)

Proceedings Article | 6 April 2020 Presentation
Jonathan Caillaux, David Bresteau, Thierry Ruchon, Federico Cilento, Fulvio Parmigiani, Ismaël Vadillotorre, Carlo Spezzani, Olivier Tcherbakoff, Pascal D'Oliveira, Pascal Salière, François Polack, David Dennetiere, Véronique Brouet, Marino Marsi
Proceedings Volume 11346, 113460C (2020) https://doi.org/10.1117/12.2555039

Proceedings Article | 12 May 2015 Paper
A. Loulergue, M. Labat, C. Evain, N. Hubert, F. Briquez, F. Marteau, C. Benabderrahmane, P. Berteaud, C. Bourassin-Bouchet, F. Bouvet, L. Cassinari, L. Chapuis, M. El Ajjouri, C. Herbeaux, M. Khojoyan, D. Dennetiere, N. Leclercq, JP. Duval, A. Lestrade, O. Marcouillé, P. Rommeluère, J.-L. Marlats, P. Morin, F. Polack, K. Tavakoli, M. Valleau, D. Zerbib, W. Yang, X. Davoine, I. Andriyash, G. Lambert, V. Malka, C. Thaury, S. Bielawski, C. Szwaj, M.-E. Couprie
Proceedings Volume 9512, 95121G (2015) https://doi.org/10.1117/12.2182422
KEYWORDS: Free electron lasers, Electron beams, Diagnostics, Plasma, Magnetism, Colorimetry, Synchrotrons, Spectroscopy, Optical testing, Electron transport

Proceedings Article | 26 September 2013 Paper
Proceedings Volume 8851, 88510G (2013) https://doi.org/10.1117/12.2026026
KEYWORDS: Mirrors, Diffraction, X-rays, Hard x-rays, Nanoprobes, Reflectivity, Tolerancing, Metrology, Point spread functions, X-ray optics

Proceedings Article | 26 September 2013 Paper
A. Somogyi, K. Medjoubi, C. Kewish, V. Leroux, M. Ribbens, G. Baranton, F. Polack, J. Samama
Proceedings Volume 8851, 885104 (2013) https://doi.org/10.1117/12.2027086
KEYWORDS: Mirrors, Coherence imaging, Monochromators, Nanoprobes, Synchrotrons, X-rays, X-ray imaging, Spatial resolution, Mechanics, Imaging systems

Proceedings Article | 3 October 2008 Paper
M. Thomasset, F. Polack
Proceedings Volume 7155, 715506 (2008) https://doi.org/10.1117/12.814695
KEYWORDS: Mirrors, Point spread functions, Spatial frequencies, Synchrotrons, Surface finishing, Sensors, Spatial resolution, X-rays, Wavefronts, Head

Showing 5 of 13 publications
Conference Committee Involvement (5)
Advances in Computational Methods for X-Ray Optics III
19 August 2014 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics II
30 August 2007 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics
2 August 2005 | San Diego, California, United States
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