Gian P. Felcher
at Argonne National Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 November 2002 Paper
Gian Felcher, Suzanne te Velthuis, Janos Major, Helmut Dosch, Charlotte Anderson, Klaus Habicht, Thomas Keller
Proceedings Volume 4785, (2002) https://doi.org/10.1117/12.451683
KEYWORDS: Scattering, Laser scattering, Reflection, Grazing incidence, Diffraction gratings, Polarization, X-rays, Diffraction, Reflectivity, Sensors

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