Grant Davis
Technical Marketing Engineer at Siemens Industry Software Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 November 2007 Paper
Proceedings Volume 6730, 67304H (2007) https://doi.org/10.1117/12.746988
KEYWORDS: Metrology, Photomasks, Computer programming, Manufacturing, Interfaces, Manufacturing equipment, Databases, Visualization, Optical proximity correction, Data modeling

Proceedings Article | 25 May 2007 Paper
Grant Davis, Sun Young Choi, Eui Hee Jung, Arne Seyfarth, Hans van Doornmalen, Eric Poortinga
Proceedings Volume 6607, 66072A (2007) https://doi.org/10.1117/12.728993
KEYWORDS: Photomasks, Image processing, Critical dimension metrology, Semiconducting wafers, Metrology, Design for manufacturing, Visualization, Lithography, Scanning electron microscopy, Interfaces

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