Prof. Guoqiang Yang
at Institute of Chemistry
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 2 June 2022
Zhihao Wang, Jinping Chen, Tianjun Yu, Yi Zeng, Guoqiang Yang, Timothée Allenet, Michaela Vockenhuber, Yasin Ekinci, Yi Li
JM3, Vol. 21, Issue 04, 041403, (June 2022) https://doi.org/10.1117/12.10.1117/1.JMM.21.4.041403
KEYWORDS: Photoresist materials, Electron beam lithography, Extreme ultraviolet lithography, Photoresist developing, Lithography, Electron beams, Polymers, Scanning electron microscopy, Line edge roughness, Polymethylmethacrylate

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