Mr. Ian Lee-Bennett Profile

Ian Lee-Bennett

Business Development Director at Taylor Hobson

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Publications (1)

Proceedings Article | 19 August 2005 Paper

Advances in interferometric surface metrology

Mike Conroy, Joe Armstrong, Ian Lee-Bennett

Proceedings Volume 5872, 587208 (2005) https://doi.org/10.1117/12.621576

KEYWORDS: Metrology, Correlation function, Visualization, 3D metrology, Signal processing, Diamond, Interferometry, Diamond machining, Diamond turning, Platinum

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