James S. Flores
Senior Detector Engineer
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 18 August 2005 Paper
Proceedings Volume 5897, 58970K (2005) https://doi.org/10.1117/12.619233
KEYWORDS: Data modeling, Charge-coupled devices, Silicon, Aerospace engineering, Medium wave, Data acquisition, Annealing, Scattering, Radiation effects, Sensors

Proceedings Article | 16 May 2003 Paper
Pooran Joshi, M. Moriguchi, Mark Crowder, Steven Droes, James Flores, Apostolos Voutsas, John Hartzell
Proceedings Volume 5004, (2003) https://doi.org/10.1117/12.482597
KEYWORDS: Thin films, Oxides, Dielectrics, Capacitors, Refractive index, Thin film devices, Plasma, Plasma enhanced chemical vapor deposition, Molybdenum, Thin film deposition

Proceedings Article | 30 April 2001 Paper
Proceedings Volume 4295, (2001) https://doi.org/10.1117/12.424858
KEYWORDS: Silicon, Metals, Crystals, Transistors, LCDs, Semiconductors, Excimer lasers, Glasses, Plasma enhanced chemical vapor deposition, Flat panel displays

Proceedings Article | 8 September 1995 Paper
Proceedings Volume 2551, (1995) https://doi.org/10.1117/12.218646
KEYWORDS: Charge-coupled devices, CCD image sensors, Image analysis, Systems modeling, Radiation effects, Signal attenuation, Temperature metrology, Detection theory, Distortion, Lead

Proceedings Article | 12 July 1993 Paper
Proceedings Volume 1900, (1993) https://doi.org/10.1117/12.148609
KEYWORDS: Charge-coupled devices, Quantum efficiency, Chlorine, Electro optical modeling, Silicon, Photons, Diffusion, Absorption, Distance measurement, Data modeling

Showing 5 of 11 publications
Conference Committee Involvement (1)
Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas
21 January 2003 | Santa Clara, CA, United States
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