Dr. Jingtian Guan
at Shanghai Jiao Tong Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 December 2022 Poster + Paper
Jingtian Guan, Ji Li, Juntong Xi
Proceedings Volume 12319, 123191N (2022) https://doi.org/10.1117/12.2643838
KEYWORDS: Deflectometry, Convolutional neural networks, Shape analysis, Phase shifts, Network architectures, Wavefront reconstruction, Visualization, Reflection, Phase shift keying, Metrology

SPIE Journal Paper | 9 February 2022
Jingtian Guan, Ji Li, Xiao Yang, Xiaobo Chen, Juntong Xi
OE, Vol. 61, Issue 06, 061407, (February 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.6.061407
KEYWORDS: Defect detection, Deflectometry, Semiconducting wafers, Convolution, Head, Fringe analysis, Optical engineering, Cameras, LCDs, Inspection

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