Dr. John C. McNulty
Principal Engineer at Exponent Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 18 February 2008 Open Access Paper
Proceedings Volume 6884, 68840B (2008) https://doi.org/10.1117/12.773640
KEYWORDS: Microelectromechanical systems, Reliability, Tunable lasers, Tunable filters, Actuators, Semiconducting wafers, Telecommunications, Silicon, Packaging, Standards development

Proceedings Article | 7 February 2007 Paper
David Schleuning, Mike Griffin, Philip James, John McNulty, Dan Mendoza, John Morales, David Nabors, Mike Peters, Hailong Zhou, Murray Reed
Proceedings Volume 6456, 645604 (2007) https://doi.org/10.1117/12.701292
KEYWORDS: Packaging, Reliability, Finite element methods, Indium, Data modeling, Semiconductor lasers, Diodes, Thermal modeling, Temperature metrology

Proceedings Article | 7 February 2007 Paper
Paul Rosenberg, Patrick Reichert, Jihua Du, Michael Fouksman, Hailong Zhou, John McNulty, Sherry Tolman, Calvin Luong
Proceedings Volume 6456, 645618 (2007) https://doi.org/10.1117/12.701303
KEYWORDS: Indium, Laser welding, Resistance, Semiconductor lasers, Reliability, Waveguides, Packaging, Diodes, Heatsinks, Thermography

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