John Schultz
Senior Dev specialist at 3M Co
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 February 2011 Paper
Michael Sykora, John Schultz, Robert Brott
Proceedings Volume 7863, 78630V (2011) https://doi.org/10.1117/12.873327
KEYWORDS: 3D displays, 3D metrology, LCDs, Diffusers, Distance measurement, Optical properties, Waveguides, Eye, Optical inspection, Optical resolution

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