Mr. K Seki Profile

K Seki

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 10 July 2018 Paper

High-contrast apodization baffle for instruments onboard solar system exploration missions

K. Enya, A. Yamazaki, H. Nakagawa, N. Terada, K. Seki, N. Fujishiro, A. Motoyoshi, O. Moriwaki

Proceedings Volume 10706, 107065I (2018) https://doi.org/10.1117/12.2312577

KEYWORDS: Apodization, Solar system, Mars, Aluminum, Manufacturing, Exoplanets, Remote sensing

Read Abstract +

We present concept and laboratory demonstration of high-contrast apodization baffle for instruments to be carried on exploration missions of the solar system. The primary science objective of the high-contrast baffle is to reveal escape of atmosphere on Mars, while other faint objects around blight sources are potential targets. We diverted heritages studied for exoplanet science and instrumentation to this work. The apodization in this work is realized by edge with microscopic Gaussian shaped structure. A simulation to confirm the concept and design of the high-contrast apodization baffle was carried out. Then, a baffle which was consisting of transparent flat substrate and thin film of aluminum on it was manufactured. The experiment was executed with He-Ne laser with wavelength of 633 nm. As the result, it was demonstrated that the apodization by the Gaussian edge is significantly working to improve the contrast. Achieved contrast is better than 10^-6.5 and 10^-8 in θ > 0.5 degree and θ > 1 degree, respectively. These results satisfy the requirement for remote sensing of the atmospheric less on Mars.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years