Dr. Kamesh V. Gadepally Profile

Dr. Kamesh V. Gadepally

at Texas Instruments Inc

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 15 September 1995 Paper

Kevin Brown, Rodney Hill, Krishna Reddy, Kamesh Gadepally

Proceedings Volume 2636, (1995) https://doi.org/10.1117/12.221137

KEYWORDS: Aluminum, Etching, Titanium, Resistance, Silicon, Tungsten, Diffusion, Metals, Tin, Oxides

Conference Committee Involvement (1)

Yield, Reliability, and Failure Analysis in Microelectronics Manufacturing

19 May 1999 | Edinburgh, United Kingdom

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Keywords/Phrases