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Kap-Joong Kim
at ETRI
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Publications (1)
Proceedings Article | 18 February 2009 Paper
Identifying resonance frequency deviations for high order nano-wire ring resonator filters based on a coupling strength variation
Sahnggi Park, Kap-Joong Kim, Duk-Jun Kim, Gyungock Kim
Proceedings Volume 7220, 72200Y (2009) https://doi.org/10.1117/12.808868
KEYWORDS: Resonators, Optical filters, Cladding, Etching, Electron beam lithography, Reactive ion etching, Optical lithography, Silicon, Digital filtering, Image filtering
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